testing sheet meaning in Chinese
检验单
Examples
- To get the test sheets for us
还帮我们偷试卷 - To get the test sheets for us
还帮我们偷试卷 - Accomplishing the development of square four point probe instrument with the function of image manipulation for testing sheet resistance automatically
4完成具有图像识别功能的全自动四探针微区电阻率测试仪的研制。 - In this paper , the circuit used for testing sheet resistance is designed using single chip processor . additionally , we have expressed van der pauw function as a polynomial form through local and global reversal development by using the normalized polynomial match , being convenient not only for programming , but also for sheet resistance testing when using van der pauw and rymaszewski methods
本文还利用单片机系统设计了薄层电阻测试电路，对于程序中用到的范德堡隐函数，利用非线性反演和规范化拟合的方法推导出其多项式显函数形式。这不仅给对我们编写程序提供了方便，也为使用范德堡法和rymaszewski法测量薄层电阻提供了便利。 - At present , the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork . in order to know the wafer ' s impurity distributing , we need test many times , so will waste a lot of time . if the wafer ' s diameter would be 300mm , this problem will be more serious . in this paper , image analysis is introduced , through pre - processing and edge picking - up , the probe tips are recognized . then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors . thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity
这样，完成200mm ( 8时)圆片杂质的扩散分布需要对许多图形进行测试，需要花费很长的时间，当测试300mm硅片时问题就更为突出。本文将图象与视觉测量系统引入四探针测试系统中，对采集到的原始探针图像进行预处理、边缘提取等操作，以便实现探针针尖的识别，然后由电机控制实现探针的自动定位。这样测试系统可以自动获得全片的薄层电阻分布，为超大规模集成电路检测杂质分布和扩散的均匀性提供信息。